polymer analysis for food packaging and
PPWR consultancy
Advanced polymer and multilayer packaging analysis using spectroscopy and AI based tools for shelf life predicting, supporting R & D, Q/A, Q/C and PPWR packaging compliance
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Advance spectroscopic integration
Advance spectroscopic integration
We provide advanced spectroscopic integration combined with AI driven predictive modelling to support data-based decision making across the entire packaging value chain. Our capabilities include accurate shelf life estimation based on AI tools, PPWR - aligned compliance modelling and in-depth material characterisation for multilayer structures and complex polymer systems.
Our solutions are designed to empower R&D teams with rapid formulations insights, enable Q/A departments to validate material performance with higher confidence, and support packaging engineers in redesigning structures to meet the upcoming PPWR regulatory requirements. From early-stage developments to regulatory compliance and product optimisation, we deliver end-to-end analytical support tailored to the future needs of the packaging industry.
What we can do and what "advanced spectroscopic integration "means?
What we can do and what "advanced spectroscopic integration "means?
It means FTIR is not used only for basic "identification" or forensic analysis but is fully integrated into:
R & D workflows
R & D workflows
rapid material screening;
formulation comparison;
identifying differences between suppliers or batches;
evaluating material compatibility;
Q/A processes
Q/A processes
batch verification;
detecting process deviation;
confirming actual material composition;
validating incoming materials;
Predictive modeling
Predictive modeling
correlating spectral features with functional properties (barrier, stability, degradation);
estimating shelf-life based on spectral markers;
predicting material behaviour over time;
PPWR-related projects
PPWR-related projects
identifying layers incompatible with recycling;
verifying actual composition for compliance;
supporting redesign of multilayer structures;
Layers measurements
Layers measurements
optical and fluorescence microscopy;
layers thickness;
tye layer depletion measuring films after delamination;
root cause analysis-Ftirµscopy
root cause analysis-Ftirµscopy
FTIR results, polymer identification, evidence compatibility, tye layer evaluation;
microscopic images for of section or defects;
thickness measurements of layers, variability;
Ftirµscopy optical/fluorescense/phase contrast
Ftirµscopy optical/fluorescense/phase contrast
reverse engineering
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